Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Applies Built-in-Self-Test (Bi. ST) and Built-in-Self-Calibration (Bi.
SC) to real applications in nanometer wireless radio design Provides on-chip testing capabilities as well as on-the-fly calibration abilities to render mixed-mode designs robust from the outset Reduces significantly high volume test costs of RF and mm.
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Part of the SpringerBriefs in Electrical and Computer Engineering book series (BRIEFSELECTRIC)