Electron Backscatter Diffraction in Materials Science

  • Adam J. Schwartz
  • Mukul Kumar
  • Brent L. Adams
  • David P. Field

Table of contents

  1. Front Matter
    Pages i-xxii
  2. Robert A. Schwarzer, David P. Field, Brent L. Adams, Mukul Kumar, Adam J. Schwartz
    Pages 1-20
  3. Jeremy K. Mason, Christopher A. Schuh
    Pages 35-51
  4. Alwyn Eades, Andrew Deal, Abhishek Bhattacharyya, Tejpal Hooghan
    Pages 53-63
  5. Austin P. Day
    Pages 65-80
  6. Michael A. Groeber, David J. Rowenhorst, Michael D. Uchic
    Pages 123-137
  7. Stephen D. Sintay, Michael A. Groeber, Anthony D. Rollett
    Pages 139-153
  8. Nathan R. Barton, Joel V. Bernier, Ricardo A. Lebensohn, Anthony D. Rollett
    Pages 155-167
  9. Surya R. Kalidindi, David T. Fullwood, Brent L. Adams
    Pages 169-175
  10. David T. Fullwood, Surya R. Kalidindi, Brent L. Adams
    Pages 177-188
  11. Bryan W. Reed, Christopher A. Schuh
    Pages 201-214
  12. Angus J. Wilkinson, David J. Dingley, Graham Meaden
    Pages 231-249
  13. Luke N. Brewer, David P. Field, Colin C. Merriman
    Pages 251-262
  14. Oleg V. Mishin, Andrew Godfrey, Dorte Juul Jensen
    Pages 263-275
  15. Terry R. McNelley, Alexandre P. Zhilyaev, Srinivasan Swaminathan, Jianqing Su, E. Sarath Menon
    Pages 277-289
  16. Sergey Mironov, Yutaka S. Sato, Hiroyuki Kokawa
    Pages 291-300
  17. John F. Bingert, Veronica Livescu, Ellen K. Cerreta
    Pages 301-315
  18. Ayman A. Salem
    Pages 317-327
  19. Stuart I. Wright, Matthew M. Nowell
    Pages 329-337
  20. Bassem S. El-Dasher, Sharon G. Torres
    Pages 339-344
  21. David J. Prior, Elisabetta Mariani, John Wheeler
    Pages 345-360
  22. Back Matter
    Pages 395-403

About this book


Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials.  The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale.

This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures.  Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique.


EBSD explained backscattered electron generation crystallography elastic strains electron microscope grain boundaries materials characterization materials characterization technique plastic strains scanning electron microscope texture determination transmission electron microscopy

Editors and affiliations

  • Adam J. Schwartz
    • 1
  • Mukul Kumar
    • 2
  • Brent L. Adams
    • 3
  • David P. Field
    • 4
  1. 1.Physical Sciences DirectorateLawrence Livermore National LaboratoryLivermoreU.S.A.
  2. 2.Chemistry, Materials, Earth, & Life Lawrence Livermore National LaboratoryLivermoreU.S.A.
  3. 3.Dept. Mechanical EngineeringBrigham Young UniversityProvoU.S.A.
  4. 4.School of Mechanical &Washington State UniversityPullmanU.S.A.

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