© 2002

Anomalous X-Ray Scattering for Material Characterization

Atomic-Scale Structure Determination


Part of the Springer Tracts in Modern Physics book series (STMP, volume 179)

About this book


The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous dispersion effect near the absorption edge of the constituent element, is one of the most powerful methods for determining the accurate partial structure functions of individual pairs of constituents or the environmental functions around specific elements in multicomponent systems. AXS is useful for both crystalline and non-crystalline systems, for studies of surface and bulk materials. This book is the first on this new method of structural characterization. It describes the basics and application principles, and also treats the specifics of application to liquid alloys, supercooled liquids, solutions, metallic glasses, oxide glasses, superconducting ionic glasses etc.


Amorphous alloys Atomic structure Crystals Materials analysis Quasicrystals REM STEM

Authors and affiliations

  1. 1.Institute for Advanced Materials ProcessingTohoku UniversitySendaiJapan

Bibliographic information

  • Book Title Anomalous X-Ray Scattering for Material Characterization
  • Book Subtitle Atomic-Scale Structure Determination
  • Authors Yoshio Waseda
  • Series Title Springer Tracts in Modern Physics
  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 2002
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Hardcover ISBN 978-3-540-43443-6
  • Softcover ISBN 978-3-662-14637-8
  • eBook ISBN 978-3-540-46008-4
  • Series ISSN 0081-3869
  • Edition Number 1
  • Number of Pages XIV, 214
  • Number of Illustrations 0 b/w illustrations, 0 illustrations in colour
  • Topics Surfaces and Interfaces, Thin Films
    Characterization and Evaluation of Materials
  • Buy this book on publisher's site
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