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© 2006

Oscillation-Based Test in Mixed-Signal Circuits

Book

Part of the Frontiers in Electronic Testing book series (FRET, volume 36)

Table of contents

  1. Front Matter
    Pages I-XV
  2. Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 1-48
  3. Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 49-95
  4. Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 97-156
  5. Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 157-203
  6. Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 205-231
  7. Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 233-295
  8. Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 297-358
  9. Back Matter
    Pages 359-452

About this book

Introduction

Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.

Keywords

Bandpass FRET Frontiers Electronic Test Mixed-Signal Circuits Oscillation-Based Signal development modeling simulation testing

Authors and affiliations

  1. 1.IMSE-CNM CSIC-Universidad de SevillaSpain
  2. 2.IMSE-CNM CSIC-Universidad de SevillaSpain
  3. 3.IMSE-CNM CSIC-Universidad de SevillaSpain
  4. 4.IMSE-CNM CSIC-Universidad de SevillaSpain

About the authors

Prof. José Luis Huertas is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, that published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design.

Bibliographic information

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