© 2006

Scanning Probe Microscopy

Atomic Scale Engineering by Forces and Currents

  • Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy

  • Provides a framework for linking scanning probe theory and simulations with experimental data

  • Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations


Part of the NanoScience and Technology book series (NANO)

Table of contents

  1. Front Matter
    Pages i-xiv
  2. Pages 11-36
  3. Pages 37-54
  4. Pages 159-206
  5. Pages 259-263
  6. Back Matter
    Pages 265-281

About this book


Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.


materials properties microscopy molecule simulation spectroscopy

Authors and affiliations

  1. 1.Laboratory of PhysicsHelsinki University of TechnologyHelsinkiFinland
  2. 2.Surface Science Research CentreThe University of LiverpoolLiverpoolBritain

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