Abstract
The optical beam deflection sensor remains the most popular force detection method used in atomic force microscopy. With the recent development of short cantilevers, a means for measuring small deflections at high frequencies has become a challenge. Minimizing the noise level of the readout electronics without significantly limiting the detection bandwidth still remains a challenge. In this work, a recently proposed trans-linear readout circuit-based technique, in which necessary analog arithmetics are done in the current domain instead of the voltage domain, is compared to a more traditional trans-impedance readout circuit-based topology. Our developed trans-impedance readout circuit recorded a noise floor of 9.48 × 10−13 V2 Hz−1 compared to 1.41 × 10−11 V2 Hz−1 for the trans-linear readout circuit. Also, the measured −3 dB bandwidth of 11 MHz for the transimpedance readout circuit was slightly higher than the 10 MHz for the trans-linear readout circuit. Trans-impedance readout circuits, with proper circuit design considerations and careful selection of electronic parts, still remain competitive for use in high-speed operations in atomic force microscopy.
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References
N. Kodera, D. Yamamoto, R. Ishikawa and T. Ando, Nature 468, 72 (2010).
M. Shibata, H. Watanabe, T. Uchihashi, T. Ando and R. Yasuda, Biophys. Physicobiol. 14, 127 (2017).
I. Casuso, F. Rico and S. Scheuring, Curr. Opin. Chem. Biol. 15, 704 (2011).
M. Shibata, H. Yamashita, T. Uchihashi, H. Kandori and T. Ando, Nat. Nanotech. 5, 208 (2010).
T. Uchihashi, R. Iino, T. Ando and H. Noji, Science 333, 755 (2011).
T. Fukuma, Y. Okazaki, N. Kodera, T. Uchihashi and T. Ando, Appl. Phys. Lett. 92, 243119 (2008).
H. Watanabe, T. Uchihashi, T. Kobashi, M. Shibata, J. Nishiyama, R. Yasuda and T. Ando, Rev. Sci. Instrum. 84, 053702 (2013).
G. Schitter, K. J. Astrom, B. E. DeMartini, P. J. Thurner, K. L. Turner and P. K. Hansma, IEEE Trans. Control Syst. Technol. 15, 906 (2007).
A. Ahmad, A. Schuh and I. W. Rangelow, Rev. Sci. Instrum. 85, 103706 (2014).
S. Necipoglu, S. A. Cebeci, Y. E. Has, L. Guvenc and C. Basdogan, IEEE Trans. Nanotechnol. 10, 1074 (2011).
R. Enning, D. Ziegler, A. Nievergelt, R. Friedlos, K. Venkataramani and A. Stemmer, Rev. Sci. Instrum. 82, 043705 (2011).
T. Fukuma, Rev. Sci. Instrum. 80, 023707 (2009).
P. E. Rutten, Rev. Sci. Instrum. 82, 073705 (2011).
D. A. Walters, J. P. Cleveland, N. H. Thomson, P. K. Hansma, M. A. Wendman, G. Gurley and V. Elings, Rev. Sci. Instrum. 67, 3583 (1996).
G. Binnig, C. F. Quate and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).
E. Meyer, Ph.D. Thesis, Basel University, Basel, Switzerland, 1990.
T. Itoh and T. Suga, Nanotechnology 4, 218 (1993).
N. V. Andreeva, Ferroelectrics 525, 178 (2018).
C. A. J. Putman, B. G. de Grooth, N. F. van Hulst and J. Greve, Ultramicroscopy 42, 1509 (1992).
B. Routley and A. J. Fleming, 2016 International Conference on Manipulation, Automation and Robotics at Small Scales (Paris, France, July 18–22, 2016), p. 1.
G. Meyer and N. M. Amer, Appl. Phys. Lett. 53, 1045 (1988).
S. Hosaka, K. Etoh, A. Kikukawa and H. Koyanagi, J. Vac. Sci. Technol. B Microelectron. Nanometer Struct. Process Meas. Phenom. 18, 94 (2000).
T. Fukuma and S. P. Jarvis, Rev. Sci. Instrum. 77, 043701 (2006).
T. Fukuma, M. Kimura, K. Kobayashi, K. Matsushige and H. Yamada, Rev. Sci. Instrum. 76, 053704 (2005).
A. Labuda, K. Kobayashi, Y. Miyahara and P. Grütter, Rev. Sci. Instrum. 83, 053703 (2012).
B. Gilbert, Electron. Lett. 11, 14 (1975).
M. J. Higgins, R. Proksch, J. E. Sader, M. Polcik, S. Mc Endoo, J. P. Cleveland and S. P. Jarvis, Rev. Sci. Instrum. 77, 013701 (2006).
N. Mullin and J. K. Hobbs, Rev. Sci. Instrum. 85, 113703 (2014).
S. Torbrügge, J. Lübbe, L. Tröger, M. Cranney, T. Eguchi, Y. Hasegawa and M. Reichling, Rev Sci. Instrum. 79, 083701 (2008).
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Alunda, B.O., Otieno, L.O., Chepkoech, M. et al. Comparative Study of Trans-linear and Trans-impedance Readout Circuits for Optical Beam Deflection Sensors in Atomic Force Microscopy. J. Korean Phys. Soc. 74, 88–93 (2019). https://doi.org/10.3938/jkps.74.88
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DOI: https://doi.org/10.3938/jkps.74.88