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Secondary Electron and Negative-Ion Emission from Metal Surface under the Bombardment by Positive Ions (H+, Cl+, HCl+)

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Abstract

A trap for positive ions (H+, Cl+, HCl+) is created within a time-of-flight mass spectrometer. The yields of secondary electrons and negative ions (HCl, H) formed due to forward and backward scattering of positive ions by steel wire at different kinetic energies (200–750 eV) are measured.

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Correspondence to A. I. Chichinin.

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Original Russian Text © A.I. Chichinin, M. Poretskiy, C. Maul, K.-H. Gericke, 2018, published in Kratkie Soobshcheniya po Fizike, 2018, Vol. 45, No. 10, pp. 21–27.

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Chichinin, A.I., Poretskiy, M., Maul, C. et al. Secondary Electron and Negative-Ion Emission from Metal Surface under the Bombardment by Positive Ions (H+, Cl+, HCl+). Bull. Lebedev Phys. Inst. 45, 303–307 (2018). https://doi.org/10.3103/S1068335618100044

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  • DOI: https://doi.org/10.3103/S1068335618100044

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