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Bulletin of the Lebedev Physics Institute

, Volume 36, Issue 1, pp 8–13 | Cite as

Integral and temporal characteristics of soft X-rays of the PF-4 plasma focus setup

  • S. P. Eliseev
  • V. Ya. Nikulin
  • P. V. Silin
Article
  • 29 Downloads

Abstract

Soft X-rays of a setup with a power from 1.5 to 5 kJ, operating with argon, were measured using X-ray pinhole cameras and SPPD 11-04 detectors. Integral measurements of X-rays in energy ranges above 1.2, 1.5, 1.8, and 2.5 keV were performed using a 4-frame pinhole camera with hole sizes of ∼250 µm. Simultaneously, the X-ray yield was measured with time resolution in the energy region of > 1.8 keV using a semiconductor detector. X-ray characteristics were experimentally studied at a capacitor bank voltage of 8–14 kV and argon pressures from 1.2 to 3 Torr. The size of hot points was estimated using the pinhole camera with a hole size of ∼20 µm as less than 13–25 µm.

Keywords

Beryllium LEBEDEV Physic Institute Plasma Focus Anode Surface Semiconductor Detector 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Allerton Press, Inc. 2009

Authors and Affiliations

  • S. P. Eliseev
  • V. Ya. Nikulin
  • P. V. Silin

There are no affiliations available

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