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Bulletin of the Lebedev Physics Institute

, Volume 36, Issue 1, pp 1–7 | Cite as

Measurement of soft X-ray radiation using the PF-4 plasma focus setup with semiconductor X-ray detectors

  • S. P. Eliseev
  • V. Ya. Nikulin
  • P. V. Silin
Article
  • 36 Downloads

Abstract

Soft X-rays were measured with time resolution at angles of 45° and 90° to the system axis in an argon atmosphere using SPPD 11-04 fast semiconductor detectors. The dependence of the X-ray yield was studied as a function of the voltage of a capacitor bank of the plasma focus in a range from 8 to 14 kV and argon pressures from 0.5 to 4 Torr. Generalization of the results obtained allowed possible interpretation of the nature of observed emission.

Keywords

LEBEDEV Physic Institute Plasma Focus Capacitor Bank Argon Pressure Current Derivative 
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Copyright information

© Allerton Press, Inc. 2009

Authors and Affiliations

  • S. P. Eliseev
  • V. Ya. Nikulin
  • P. V. Silin

There are no affiliations available

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