Measurement of soft X-ray radiation using the PF-4 plasma focus setup with semiconductor X-ray detectors
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Soft X-rays were measured with time resolution at angles of 45° and 90° to the system axis in an argon atmosphere using SPPD 11-04 fast semiconductor detectors. The dependence of the X-ray yield was studied as a function of the voltage of a capacitor bank of the plasma focus in a range from 8 to 14 kV and argon pressures from 0.5 to 4 Torr. Generalization of the results obtained allowed possible interpretation of the nature of observed emission.
KeywordsLEBEDEV Physic Institute Plasma Focus Capacitor Bank Argon Pressure Current Derivative
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