Abstract
Degradation (D) of organic light-emitting diodes (OLEDs) based on new different-ligand complexes of terbium salicylate (Tb(Sal)3(TPPO)2) and 2-phenoxybenzoate (Tb(pobz)3(TPPO)2) with triphenyl phosphinoxide (TPPO) was studied. Initial reversible D is associated with charge carrier trap filling. A temperature increase, applied stress relief, and short-term irradiation with UV light lead to trapped charge carrier release and electroluminescence (EL) intensity recovery. During strong heating, irreversible D is observed after the recovery; this D requires in addition an electric field (EF). Intense UV light causes D without EF. The use of ac bias voltage eliminates reversible D, and sealing retards irreversible long-term D.
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Original Russian Text © L.S. Lepnev, A.A. Vashchenko, A.G. Vitukhnovskii, S.V. Eliseeva, O.V. Kotova, N.P. Kuzmina, 2007, published in Kratkie Soobshcheniya po Fizike, 2007, Vol. 34, No. 4, pp. 12–20.
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Lepnev, L.S., Vashchenko, A.A., Vitukhnovskii, A.G. et al. Degradation of organic light-emitting diodes based on different-ligand complexes of terbium (III) salicylate and 2-phenoxybenzoate. Bull. Lebedev Phys. Inst. 34, 102–106 (2007). https://doi.org/10.3103/S1068335607040021
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DOI: https://doi.org/10.3103/S1068335607040021