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Method of determination of palladium concentration for C-Pd nanostructural films as a function of film thickness, roughness and topography

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Materials Science-Poland

Abstract

In this paper a method of determination of Pd in a carbon-palladium film (C-Pd film) deposited on a quartz substrate is presented. This method is based on energy dispersive X-ray spectroscopy (EDX) and all experiments were performed using a scanning electron microscope (SEM) equipped with EDX system. Qualitative and quantitative analyses were carried out for C-Pd films prepared by PVD method in different technological conditions. It was shown that results of the experiments depended on the structural model, film thickness and electron beam energy used for Pd content calculation.

This method enabled us to conclude on the homogeneity of palladium distribution in the whole volume of carbonaceous matrix, depending on the parameters of PVD process. Additionally, these studies showed that a different palladium concentration in C-Pd films had a significant impact on their topography and morphology.

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References

  1. Efremenko I., J. Mol. Catal. A-Chem., 173 (2001), 19.

    Article  Google Scholar 

  2. Pałosz B., Composites, 4(9) (2004), 16.

    Google Scholar 

  3. Dankerta O., Pundt A., Appl. Phys. Lett., 81(9) (2002), 1618.

    Article  Google Scholar 

  4. Jewell L.L., Davis B.H., Appl. Catal. A-Gen., 310 (2006), 1.

    Article  Google Scholar 

  5. Sobczak K., Dłużewski P., Klepka M.T., Kurowska B., Czerwosz E., Int. J. Hydrogen. Energ., 37 (2012), 18556.

    Article  Google Scholar 

  6. Czerwosz E., Dłużewski P., Kowalska E., Kozłowski M., Rymarczyk J., Phys. Status. Solidi. C, 8(7–8) (2011), 2527.

    Article  Google Scholar 

  7. Kowalska E., Czerwosz E., Kamińska A., Kozłowki A., J. Therm. Anal. Calorim., 108 (2012), 1017.

    Article  Google Scholar 

  8. Asahina S., Togashi T., Terasaki O., Takami S., Adschiri T., Shibata M., Erdman N., Microsc. Anal., 11 (2012), 12.

    Google Scholar 

  9. Czerwosz E., Diduszko R., Dłużewski P., Kęczkowska J., Kozłowski M., Rymarczyk J., Suchańska M., Vacuum, 82 (2008), 372.

    Article  Google Scholar 

  10. Rymarczyk J., Czerwosz E., Richter A., Cent. Eur. J. Phys., 9 (2011), 300.

    Article  Google Scholar 

  11. Newbury D.E., J. Res. Natl. Inst. Stan., 107 (2002), 605.

    Article  Google Scholar 

  12. Barbacki A., Mikroskopia elektronowa, Wydawnictwo Politechniki Poznańskiej, Poznań, 2007.

    Google Scholar 

  13. Lavrentłev Y.G, Korolyuk V.N., Usova L.V., J. Anal. Chem.+, 59 (2004), 600.

    Article  Google Scholar 

  14. Pouchou J.L., Pichoir F., Quantitative analysis of homogeneous or stratified microvolumes applying the model “PAP”, in: K.F.J. Heinrich, D. Newbury (Eds.), Electron Probe Quantification, Plenum Press, New York and London, 1991, p. 31.

    Chapter  Google Scholar 

  15. Czerwosz E., Wronka H., Rymarczyk J., Dłużewski P., Multi-layers film composed of carbonpalladium layers and method of its preparation, Patent No. 406192, 22.11.2013.

  16. http://www.gel.usherbrooke.ca/casino/index.html.

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Authors and Affiliations

  1. Tele & Radio Research Institute, Ratuszowa 11, 03-450, Warsaw, Russia

    Joanna Rymarczyk & Mirosław Kozłowski

Authors
  1. Joanna Rymarczyk
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  2. Mirosław Kozłowski
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Correspondence to Joanna Rymarczyk.

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Rymarczyk, J., Kozłowski, M. Method of determination of palladium concentration for C-Pd nanostructural films as a function of film thickness, roughness and topography. Mater Sci-Pol 32, 228–235 (2014). https://doi.org/10.2478/s13536-013-0194-5

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  • DOI: https://doi.org/10.2478/s13536-013-0194-5

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