Ultrafast Optical Measurements of Acoustic Phonon Attenuation in Amorphous and Nanocrystalline Silicon

Abstract

We have measured the attenuation of longitudinal acoustic waves in a series of amorphous and nanocrystalline silicon films using picosecond ultrasonics. We determined the attenuation of amorphous Si to be lower than what is predicted by theories based on anharmonic interactions of the ultrasound wave with localized phonons or extended resonant modes. We determined the attenuation of nanocrystalline Si to be nearly one order of magnitude higher than amorphous Si.

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Correspondence to Joseph A. Andrade.

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Andrade, J.A., Rachmilowitz, B.E., Daly, B.C. et al. Ultrafast Optical Measurements of Acoustic Phonon Attenuation in Amorphous and Nanocrystalline Silicon. MRS Online Proceedings Library 1536, 147–153 (2013). https://doi.org/10.1557/opl.2013.909

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