Elastic strains in polycrystalline UO2 samples implanted with He: micro Laue diffraction measurements and elastic modeling

Abstract

In the framework of the study of long-term storage of the spent nuclear fuel, polycrystalline UO2 samples have been implanted with He ions The thin implanted layer, close to the free surface is subjected to elastic stresses which are studied by x-ray diffraction (micro Laue diffraction) and a mechanical modeling A simple expression of the displacement gradient tensor has been evidenced; it concerns only three terms (ε3, ε4 and ε5) which strongly evolve with considered grain orientations. Finally, we show that results obtained with micro diffraction are in very good agreement with conventional x-ray diffraction measurements done in laboratory at macro scale.

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Correspondence to Axel Richard.

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Richard, A., Castelier, E., Palancher, H. et al. Elastic strains in polycrystalline UO2 samples implanted with He: micro Laue diffraction measurements and elastic modeling. MRS Online Proceedings Library 1514, 125 (2013). https://doi.org/10.1557/opl.2013.448

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