In this study electron backscatter diffraction (EBSD) investigation is carried out for CuIn1-xGaXS2 (CIGS2) samples that were prepared by two stage process in which the initial precursor was deposited by DC magnetron sputtering followed by sulfurization in conventional furnace. Due to high surface roughness, low quality EBSD signal was obtained in the samples that were initially polished with ion milling. Polishing with dimpler grinder followed by chemical treatment with bromine/methanol solution improved the quality of EBSD patterns. Efforts are being made to build the database for CIGS2 in the system using high quality EBSD patterns and finally to obtain grain orientation maps.
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Kaul, A., Shirish, A.P., Neelkanth, G.D. et al. Structural Study of CIGS2 Thin Film Absorbers using EBSD Technique. MRS Online Proceedings Library 1323, 344 (2011). https://doi.org/10.1557/opl.2011.828