Comparative Study of HgI2, PbI2 and TlBr Films Aimed for Ionizing Radiation Detection in Medical Imaging

Abstract

Wide bandgap semiconductor films were obtained by spray pyrolysis, thermal evaporation and casting. These films were characterized under similar conditions in order to compare their structures, surface morphology and photocurrent properties. All films show either a crystalline or a polycrystalline structure. SEM pictures of sprayed films present holes and fissures and non-total covering of the substrate. The photoresponse was obtained for evaporated TlBr films, HgI2 casted with polystyrene (PS) scaffold, sprayed and evaporated PbI2 films. The photo to dark current ratio is discussed as well as the difference of photo to dark current at an electric field of 100 V/cm. The discussion also focuses on a future optimized material.

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Correspondence to Marcelo Mulato.

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Mulato, M., Condeles, J.F., Ugucioni, J.C. et al. Comparative Study of HgI2, PbI2 and TlBr Films Aimed for Ionizing Radiation Detection in Medical Imaging. MRS Online Proceedings Library 1341, 707 (2011). https://doi.org/10.1557/opl.2011.1108

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