Correlation between the trap state spectra and dielectric behavior of CaCu3Ti4O12

Abstract

The temperature dependence of the various electric relaxation times in the perovskite oxide CaCu3Ti4O12 (CCTO) is determined (i) by trap state spectroscopy and (ii) by the dielectric loss function. A similarity in both number and properties of the (i) and (ii) relaxation times was found, suggesting that the dielectric response is strongly correlated with the trap state relaxation, although some differences remain. One or more dipoles developing charged trap states are considered responsible, and the experimental dielectric response of CCTO and Mn substituted CCTO are explored.

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Correspondence to C. P. Yang.

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Barner, K., Luo, X.J., Song, X.P. et al. Correlation between the trap state spectra and dielectric behavior of CaCu3Ti4O12. Journal of Materials Research 26, 395–406 (2011). https://doi.org/10.1557/jmr.2010.28

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