Development of microstructure in Tl-2212 thin films and possible influence on microwave surface resistance values

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Speller, S.C., Wu, H., Rek, Z.U. et al. Development of microstructure in Tl-2212 thin films and possible influence on microwave surface resistance values. Journal of Materials Research 21, 1645–1657 (2006). https://doi.org/10.1557/jmr.2006.0208

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