Fig. 4
High-resolution XRD rocking curve of the HVPE ELO GaN sample shown in Fig. 1. Two separated “tilt” diffraction peaks appear on both side of the major diffraction peak.
Fig. 4 | MRS Internet Journal of Nitride Semiconductor Research
High-resolution XRD rocking curve of the HVPE ELO GaN sample shown in Fig. 1. Two separated “tilt” diffraction peaks appear on both side of the major diffraction peak.