Study of HgTe-cdTe Multilayer Structures by Transmission Electron Microscopy

Abstract

A transmission electron microscope study of HqTe-CdTe multilayer structures grown by molecular beam epitaxy (MBE) on (100) Cd Zn Te is presented. Both cross-sectional and plain-view observations show highly reaular structures of superlattices and tunnel structures. Dislocation densities estimated by Plan-view observations are of the order of 104 cm−2 in these multilayer structures. A quantitative characterization of interface sharpness of superlattices has been carried out by intensity analysis of satellite spots in electron diffraction patterns. It is shown that interfaces in these superlattices are hichly abrupt with a width of one or two monolayers. These observations suggest the effectiveness of the use of lattice-matched substrates to qrow high quality HgTe-CdTe multilayer structures.

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Correspondence to N. Otsuka.

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Otsuka, N., Ihm, Y.E., Harris, K.A. et al. Study of HgTe-cdTe Multilayer Structures by Transmission Electron Microscopy. MRS Online Proceedings Library 90, 217 (1986). https://doi.org/10.1557/PROC-90-217

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