Nanoscale Measurements of Electronic Properties in Organic Thin Film Transistors

Abstract

Kelvin probe force microscopy was used for extraction of the threshold and the pinch off voltages in organic thin film transistors. The first was determined by direct detection of the charge accumulation onset and the latter by a direct observation of the pinch off region formation. In addition, an effective threshold voltage shift can be extracted from the pinch-off voltage as a function of charge concentration. The dependence of the effective threshold voltage on the gate voltage must be considered when calculating charge carrier concentrations in organic thin film transistors.

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Correspondence to Oren Tal.

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Tal, O., Rosenwaks, Y., Roichman, Y. et al. Nanoscale Measurements of Electronic Properties in Organic Thin Film Transistors. MRS Online Proceedings Library 871, 45 (2005). https://doi.org/10.1557/PROC-871-I4.5

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