Ni nanoparticles elaborated with an Ar ion polishing technique.

Abstract

Ni nanoparticles where obtained from a Ni sample milled with Ar ions by using a Gatan precision ion polishing system, normally used for Transmission Electron Microscopy (TEM) sample preparation. Deposition of Ni nanoparticles was performed over two different surfaces: on a double sided carbon tape and, on a Cu grid covered with collodion film. A continuos film of Ni was characterized, over the carbon tape by SEM and EDAX techniques. The last surface was analysed by TEM. In both cases, a thin film composed of Ni nanoparticles, was founded and result obtained by TEM, show a nanoparticle diameter of about 4 nm.

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Acknowledgments

Authors express their gratitude to Jorge Hernandez for his very valuable help along this work. Financial support from UANL and CONACYT (Mexican Council for Science and Technology) is also recognised.

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Correspondence to Alejandro Torres-Castro.

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Torres-Castro, A., López-Cuéllar, E., Ortiz-Méndez, U. et al. Ni nanoparticles elaborated with an Ar ion polishing technique.. MRS Online Proceedings Library 818, 56–59 (2004). https://doi.org/10.1557/PROC-818-M11.23.1

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