Optical and Nanomechanical Characterization of an Omnidirectional Reflector Encompassing 850 nm Wavelength

MRS Online Proceedings Library volume 817, pages112–117(2004)Cite this article

Abstract

We demonstrate that multilayers composed of nineteen alternating layers of tin sulfide and silica can function as omnidirectional reflectors. These materials exhibit omnidirectional reflectivity for a range of frequencies in the near infra-red (NIR) encompassing the 850 nm wavelength. A refractive index contrast of 2.7/1.46 is achieved, one of the highest values demonstrated until now in NIR photonic bad gaps. In addition, new nanoindentation procedures have been developed to measure mechanical properties of these fine laminate materials, and demonstrate that tin sulfide-silica multilayers are mechanically stable for practical applications.

This is a preview of subscription content, access via your institution.

Access options

Buy single article

Instant access to the full article PDF.

US$ 39.95

Tax calculation will be finalised during checkout.

References

  1. 1

    E. Yablonovitch, Phys. Rev. Lett. 58, 2059 (1987).

    CAS  Article  Google Scholar 

  2. 2

    Y. Fink, J. N. Winn, S. Fan, C. Chen, J. Michel, J. D. Joannopoulos, and E. L. Thomas, Science 282, 1679 (1998).

    CAS  Article  Google Scholar 

  3. 3

    M. Deopura, C.K. Ullal, B. Temelkuran and Y. Fink, Optics Letters, 26, 17, 1370–1372 (2001).

    Article  Google Scholar 

  4. 4

    S. D. Hart, G. R. Maskaly, B. Temelkuran, P. H. Prideaux, J. D. Joannopoulos, Y. Fink., Science 296, 511–513 (2002).

    Article  Google Scholar 

  5. 5

    M. Deopura, Y. Fink and C. A. Schuh, MS&T 2003 Proceedings, Chicago Meeting.

  6. 6

    M. Müller, R. Zentel, T. Maka, S. G. Romanov, and C. M. Sotomayor Torres Advanced Materials 12, 20 (2000).

    Google Scholar 

  7. 7

    P. A. Lee, G. Said, R. Davis, and T. H. Lim, J. Phys. Chem. Solids 30, 2719 (1989).

    Article  Google Scholar 

  8. 8

    M Deopura, SM thesis, Massachusetts Institute of Technology (2003).

  9. 9

    F. Abeles, Ann. Phys. 5, 706 (1950).

    Article  Google Scholar 

  10. 10

    K. N. Rao, L. Shivlingappa and S. Mohan, Mater. Sci. & Engg., B8, 38 (2003).

    Google Scholar 

Download references

Author information

Affiliations

  1. Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts, 02139, USA

    Manish Deopura, Yoel Fink & Christopher A. Schuh

Authors
  1. Manish Deopura
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Yoel Fink
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Christopher A. Schuh
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Manish Deopura.

Rights and permissions

Reprints and Permissions

About this article

Cite this article

Deopura, M., Fink, Y. & Schuh, C.A. Optical and Nanomechanical Characterization of an Omnidirectional Reflector Encompassing 850 nm Wavelength. MRS Online Proceedings Library 817, 112–117 (2004). https://doi.org/10.1557/PROC-817-L5.8

Download citation