This paper examines the effectiveness of scanning transmission electron microscopy (STEM) as an analytical tool for determining composition in multi-phase polymer blend microstructures. The polymer blend polystyrene (PS) - polyether sulphone (PES) thin film used in this study exhibited a two-phase microstructure consisting of PES-rich inclusions, ranging from 0.2μm to 1.2μm in diameter, in a PS-rich matrix. Emphasis in this presentation is placed on the use of annular dark-field (ADF) STEM image contrast to infer information concerning the local composition of adjacent microstructural features.
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S.J. Pennycook, S.D. Berger, and R.J. Culbertson, submitted to Journal of Microscopy.
P.J. Andree, J.E. Mellema, and R.W.H. Ruigrok, Ultramicroscopy 17 (1985) 237–242.
K.E. Sickafus, S.D. Berger, and A.M. Donald, to be submitted for publication.
C. Colliex, in Advances in Optical and Electron Microscopy,9, eds. R. Barer and V.E. Cosslett, Academic Press, London and New York, 1984.
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Sickafus, K.E., Berger, S.D. & Donald, A.M. Stem Observations of the Microstructures Present in Polymer Blend Thin Films.. MRS Online Proceedings Library 79, 115–121 (1986). https://doi.org/10.1557/PROC-79-115