Meyer-Neldel Rule in Deep-Level-Transient-Spectroscopy and its Ramifications

Abstract

This paper presents data showing a Meyer-Neldel rule (MNR) in InGaAsN alloys. It is shown that without this knowledge, significant errors will be made using Deep-Level Transient-Spectroscopy (DLTS) emission data to determine capture cross sections. By correctly accounting for the MNR in analyzing the DLTS data the correct value of the cross section is obtained.

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Correspondence to Richard S. Crandall.

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Crandall, R.S. Meyer-Neldel Rule in Deep-Level-Transient-Spectroscopy and its Ramifications. MRS Online Proceedings Library 763, 25 (2002). https://doi.org/10.1557/PROC-763-B2.5

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