Skip to main content
SpringerLink
Log in

Electrical Characterization of Nanostructured Carbon Films Produced by Supersonic Cluster Beam Deposition

  • Published:
MRS Online Proceedings Library Aims and scope

Abstract

Electrical conduction in nanostructured carbon (ns-C) films produced by deposition of a supersonic beam of neutral carbon clusters has been studied. The d.c. conduction properties of these films have been measured in-situ during the deposition process and ex-situ as a function of the temperature in vacuum and in ambient of different gases (H2, N2, CH4, He). The ns-C films exhibit an ohmic behavior with a room temperature resistivity in the range 10MΩcm-1GΩcm depending on the growth and storage conditions. Conductivity vs. temperature measured in vacuum in the range 300-400K is characterized by activation energies in the range 0.3-0.7eV, the current response does not differ significantly in gas atmosphere.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. N.F. Mott and E.A. Davis, Electronic processes in non-crystalline materials, Clarendon Press, Oxford, 1979

    Google Scholar 

  2. K. Shimakawa, and K. Miyake, Phys. Rev. B 39, 7578 (1989).

    Article  CAS  Google Scholar 

  3. C. Godet, Phyl. Mag. B 81, 205 (2001)

    Article  CAS  Google Scholar 

  4. J. Robertson, Adv. Phys. 35, 317 (1986).

    Article  CAS  Google Scholar 

  5. J. Robertson, Phyl. Mag. 66, 199 (1992)

    Article  CAS  Google Scholar 

  6. V. Paillard, M. Meaudre, P. Melinon, V. Dupuis, J.P. Perez, S. Vignoli, A. Perez, R. Meaudre, J. Non-Cryst. Solids 191, 174 (1995)

    Article  CAS  Google Scholar 

  7. E. Barborini, P. Piseri, A. Li Bassi, A. C. Ferrari, C. Bottani, P. Milani, Chem. Phys. Lett. 300, 633 (1999).

    Article  CAS  Google Scholar 

  8. E. Barborini, P. Piseri, P. Milani, J. Phys. D 32, L105 (1999).

    Article  CAS  Google Scholar 

  9. M. Bruzzi, P. Piseri, E. Barborini, G. Benedek, P. Milani, Diam. Relat. Mat. 10, 989 (2001).

    Article  CAS  Google Scholar 

  10. J. Besold, R. Thielsch, N. Matz, C. Frenzel, R. Born, A. Möbius, Thin Solid Films 293, 96 (1997).

    Article  CAS  Google Scholar 

  11. P. Milani, M. Ferretti, P. Piseri, C.E. Bottani, A. Ferrari, A Li Bassi, G. Guizzetti, M. Patrini J. Appl. Phys. 82, 5793 (1997).

    Article  CAS  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Dipartimento di Fisica, INFM -Università degli Studi di Milano, Via Celoria 16, 20133, Milano, Italy

    Paolo Piseri, Emanuele Barborini, Gero Bongiorno & Paolo Milani

  2. Dipartimento di Energetica, INFM -Università di Firenze, Via S. Marta 3, 50139, Firenze, Italy

    Mara Bruzzi & Stefania Miglio

Authors
  1. Paolo Piseri
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Emanuele Barborini
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Mara Bruzzi
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. Stefania Miglio
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. Gero Bongiorno
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. Paolo Milani
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Piseri, P., Barborini, E., Bruzzi, M. et al. Electrical Characterization of Nanostructured Carbon Films Produced by Supersonic Cluster Beam Deposition. MRS Online Proceedings Library 704, 9381 (2001). https://doi.org/10.1557/PROC-704-W9.38.1

Download citation

  • Published:

  • DOI: https://doi.org/10.1557/PROC-704-W9.38.1

Search

Navigation