Deuteron Magnetic Resonance in a-Si and a-SiGe Produced from Fluorides

Abstract

Deuteron magnetic resonance line shapes and spin lattice relaxation times are presented for a-Si:D,F and a-SiGe:D,F. These parameters differ from those for typical a-Si:D,H samples, but in some respects are similar to those for an annealed a-Si:D,H sample. The a-SiGe:D,F spectra display an unusually large broad central weakly bound D resonance component and a barely-resolved Ge-D quadrupolar doublet. Comparisons indicate substantial differences in void morphology between the a-Si:D,F and a-SiGe:D,F.

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Correspondence to V. P. Bork.

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Supported in part by NSF Grants 83-04473 and 85-03083 and by SERI under subcontract XB-2-02144-1 of prime contract EG-77-C-01-4042 with The Department of Energy.

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Bork, V.P., Fedders, P.A., Norberg, R.E. et al. Deuteron Magnetic Resonance in a-Si and a-SiGe Produced from Fluorides. MRS Online Proceedings Library 70, 307–312 (1986). https://doi.org/10.1557/PROC-70-307

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