The critical dose for amorphisation, Dc, of two end-member zirconolites (CaZrTi2O7) with different stacking fault densities, was measured as a function of irradiation temperature from 20 K to 623 K using the HVEM-Tandem Facility at Argonne National Laboratory (ANL). Below 473 K, the Dc, values of both samples are identical within experimental error, showing only a small increase in Dc, from (2.5 to 4.6) × 1018 ions m−2 between 20 K and 473 K. At temperatures above 473 K, the data for the zirconolite containing many stacking faults is bracketed by two data sets from almost crystallographically perfect end-member zirconolites: one collected in this study and one collected in a previous study. The raw Dc versus temperature data from the zirconolites in this and a previous study suggest that the critical temperature above which samples cannot be amorphised and/or recrystallisation is complete, Tc, is between 600 and 1000 K. The data sets collected in this study are discussed in relation to a current model.
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Smith, K.L., Blackford, M.G., Lumpkin, G.R. et al. Temperature Dependence of Ion Irradiation Induced Amorphisation of Zirconolite. MRS Online Proceedings Library 608, 487 (1999). https://doi.org/10.1557/PROC-608-487