Nanocrystal Thickness Information from Z-Stem: 3-D Imaging in One Shot

Abstract

We have applied Atomic Number Contrast Scanning Transmission Electron Microscopy (Z-Contrast STEM) towards the study of colloidal CdSe semiconductor nanocrystals embedded in MEH-PPV polymer films.

For typical nanocrystal thicknesses, the image intensity is a monotonie function of thickness. Hence an atomic column-resolved image provides information both on the lateral shape of the nanocrystal, as well as the relative thickness of the individual columns.

We show that the Z-Contrast image of a single CdSe nanocrystal is consistent with the predicted 3-D model derived from considering HRTEM images of several nanocrystals in different orientations. We further discuss the possibility of measuring absolute thicknesses of atomic columns if the crystal structure is known.

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References

  1. 1.

    Murray C.B., Norris D.J. & Bawendi M.G. Journal Of the American Chemical Society 115, 8706–8715 (1993).

    CAS  Article  Google Scholar 

  2. 2.

    Goldstein A.N., Echer C.M. & Alivisatos A.P. Science 256, 1425–7 (1992).

    CAS  Article  Google Scholar 

  3. 3.

    Vossmeyer T., {etet al.} Science 267, 1476–9 (1995)

    CAS  Article  Google Scholar 

  4. 4.

    Herron N., Calabrese J.C., Farneth W.E. & Wang Y. Science 259, 1426–8 (1993)

    CAS  Article  Google Scholar 

  5. 5.

    Peng X.G., Wickham J. & Alivisatos A.P. Journal Of the American Chemical Society 120, 5343–5344 (1998)

    CAS  Article  Google Scholar 

  6. 6.

    Blanton S.A., Hines M.A. & Guyot-Sionnest P. Applied Physics Letters 69, 3905–7 (1996)

    CAS  Article  Google Scholar 

  7. 7.

    Efros A.L. & Rosen M. Physical Review Letters 78, 1110–13 (1997)

    CAS  Article  Google Scholar 

  8. 8.

    Empedocles S. & Bawendi M. Accounts of Chemical Research, 389–396 (1999)

  9. 9.

    Klein D.L., McEuen P.L., Bowen Katari J.E., Roth R. & Alivisatos A.P. Applied Physics Letters 68, 2574–6 (1996)

    CAS  Article  Google Scholar 

  10. 10.

    Nirmal M., {etet al.} Nature 383, 802–4 (1996)

    CAS  Article  Google Scholar 

  11. 11.

    Tittel J., {etet al.} Journal of Physical Chemistry B 101, 3013–3016 (1997)

    CAS  Article  Google Scholar 

  12. 12.

    Shiang J.J., Kadavanich A.V., Grubbs R.K. & Alivisatos A.P. Journal of Physical Chemistry 99, 17417–17422 (1995)

    CAS  Article  Google Scholar 

  13. 13.

    Kadavanich A.V. {etet al.}, in Advances in Microcrystalline and Nanocrystalline Semiconductors - 1996 (eds. Collins R.W.) 353–8. (Mater. Res. Soc, Boston, MA, USA, 1996).

    Google Scholar 

  14. 14.

    Pennycook S.J., Jesson D.E., McGibbon A.J. & Nellist P.D. Journal of Electron Microscopy 45, 36–43 (1996)

    CAS  Article  Google Scholar 

  15. 15.

    Nellist P.D. & Pennycook S.J. Journal of Microscopy-Oxford, 159–170 (1998)

    Google Scholar 

  16. 16.

    Bowen Katari J.E., Colvin V.L. & Alivisatos A.P. Journal of Physical Chemistry 98, 4109–17 (1994)

    Article  Google Scholar 

  17. 17.

    Wudl F. & Srdanov G. in United States Patent (United States of America, 1993).

    Google Scholar 

  18. 18.

    Burch S.F., Gull S.F. & Skilling J. Computer Vision, Graphics, and Image Processing 23, 113–28 (1983)

    Article  Google Scholar 

  19. 19.

    Skilling J. & Bryan R.K. Monthly Notices of the Royal Astronomical Society 211, 111–24 (1984)

    Article  Google Scholar 

  20. 20.

    Skilling J. & Sibisi S. in Invited and Contributed Papers from the Conference (ed. Johnson M.W.) 1–21 (lOP, Chilton, UK, 1990).

  21. 21.

    Pina R.K. & Puetter R.C. Publications of the Astronomical Society of the Pacific 105, 630–637 (1993)

    Article  Google Scholar 

  22. 22.

    Puetter R.C. International Journal of Imaging Systems and Technology 6, 314–331 (1995)

    Article  Google Scholar 

  23. 23.

    Pennycook S.J. & Jesson D.E. Physical Review Letters 64, 938 (1990)

    CAS  Article  Google Scholar 

  24. 24.

    Jesson D.E. & Pennycook S.J. Proceedings of the Royal Society of London, Series A (Mathematical and Physical Sciences) 441, 261–81 (1993)

  25. 25.

    Pennycook S.J. & Nellis P.D. in Impact of Electron Scanning Probe Microscopy on Materials Research (eds. Rickerby D., Valdré G. & Valdré U.) (Kluwer Academic Publishers, The Netherlands, 1999).

Download references

Acknowledgments

The research presented here was funded by the Department of Energy, Basic Energy Sciences, Materials Sciences Division.

We wish to thank R. Puetter for performing the pixon reconstruction shown. We also wish to thank A. Yahil and Pixon LLC for a research use licence to the commercial PixonTM code.

AVK gratefully acknowledges the assistance of P. D. Nellist, B. E. Rafferty and M. F. Chisholm in the operation of the STEM.

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Correspondence to A. V. Kadavanich.

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Kadavanich, A.V., Kippeny, T., Erwin, M. et al. Nanocrystal Thickness Information from Z-Stem: 3-D Imaging in One Shot. MRS Online Proceedings Library 589, 229 (1999). https://doi.org/10.1557/PROC-589-229

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