Relationship Between Structure and Luminescent Properties of Epitaxial Grown Y2O3:Eu Thin Films on LaAlO3 Substrates


Cathodoluminescence images of individual pores have been obtained at nanometer resolution in europium-activated yttrium oxide (Y2O3:Eu) (001) thin films, epitaxially grown on LaAlO3 (001) substrates. Comparison with Z-contrast images, obtained simultaneously, directly show the “dead layer” to be about 5 nm thick. This “dead layer” is the origin of the reduced emission efficiency with increasing pore size. Pore sizes were varied by using different substrate temperatures and laser pulse repetition rates during film growth. These films are epitaxially aligned with the substrate, which is always Al terminated.

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The authors are grateful to A. Kadavanich for assistance with the CL detection system. The work at ORNL was sponsored by the Division of Materials Sciences, U.S. Department of Energy, under Contract No. DE-AC05-96OR22464 with Lockheed Martin Energy Research Corporation, and by appointment to the ORNL Postdoctoral Research Program administrated jointly by ORISE and ORNL. The work at University of Florida was supported by the Phosphor Technology Center of Excellence by DARPA Grant No. MDA972-93-1-0030.

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Gao, HJ., Duscher, G., Fan, X.D. et al. Relationship Between Structure and Luminescent Properties of Epitaxial Grown Y2O3:Eu Thin Films on LaAlO3 Substrates. MRS Online Proceedings Library 589, 203 (1999).

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