Abstract
The use of GaN/polymer nanocomposites in optoelectronics requires a perfect control of the GaN dispersion in the polymer matrix. This cannot be achieved without a good knowledge of the first atomic layer of the GaN nanoparticles. This paper reports the characterization of the surface chemical species of a GaN nanosized powder by diffuse reflectance infrared Fourier transform spectrometry.
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Acknowledgement
The authors acknowledge Prof. J. Kumar and K Yang of the Center for Advanced Materials and Department of Physics at the University of Massachusetts at Lowel for the PL measurements and also for discussions.
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Gonsalves, K.E., Carlson, G. & Baraton, MI. Drifts surface characterization of Zincblende nanostructured GaN. MRS Online Proceedings Library 501, 191–196 (1997). https://doi.org/10.1557/PROC-501-191
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