Simulation of Alkali Migration in β′′-Alumina Under Ion Bombardment

MRS Online Proceedings Library volume 389, pages41–46(1995)Cite this article

Abstract

Among the different effects induced by ion implantation into dielectric solids, the enhancement of the ionic mobility is the most important regarding practical applications. We simulated the Na migration in a super-ionic conductor, sodium β″-alumina, irradiated with Ar (E=200 keV) at room temperature. A theoretical model to describe the electric field originated in the bombarded region near the surface was developed. The model emphasizes the relation between the electric field and the energy deposited by the ions in the ionization process.

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Affiliations

  1. Departamento de Fisica, CFM/UFSC, P. O. Box 476, Florianópolis, SC, 88040-900, Brazil

    Paulo C. T. D’Ajello & André A. Pasa

Authors
  1. Paulo C. T. D’Ajello
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  2. André A. Pasa
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Correspondence to Paulo C. T. D’Ajello.

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D’Ajello, P.C.T., Pasa, A.A. Simulation of Alkali Migration in β′′-Alumina Under Ion Bombardment. MRS Online Proceedings Library 389, 41–46 (1995). https://doi.org/10.1557/PROC-389-41

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