Growth and Characterization of Fept Compound thin Films

MRS Online Proceedings Library volume 384, pages91–96(1995)Cite this article

Abstract

FePt alloy films were deposited at 50 and 49°C onto amorphous SiO2 and single crystal [001] MgO and [0001] Al2O3 using DC magnetron cosputtering, resulting in polycrystalline and [001] and [111] epitaxial films, respectively. High temperature deposition resulted in ordered films with the tetragonal Ll structure and out-of-plane magnetic easy axes while low temperature deposition yielded chemically disordered fcc alloys with in-plane easy axes. Significant modification of the magneto-optic Kerr spectrum is observed for ordered relative to disordered alloys for all orientations. The Kerr rotation has a strong orientation dependence for the ordered, but not disordered films.

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  1. Department of Materials Science and Engineering, Stanford University, Stanford, CA, 94305, USA

    M.R. Visokay & R. Sinclair

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  1. M.R. Visokay
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  2. R. Sinclair
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Correspondence to M.R. Visokay.

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Visokay, M., Sinclair, R. Growth and Characterization of Fept Compound thin Films. MRS Online Proceedings Library 384, 91–96 (1995). https://doi.org/10.1557/PROC-384-91

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