A Model of Superlattice Yield Stress and Hardness Enhancements

MRS Online Proceedings Library volume 382, Article number: 291 (1995) Cite this article

Abstract

A model is presented that explains the yield stress and hardness enhancements that have been observed in superlattice thin films. The predicted strength/hardness enhancement increased with increasing superlattice period, Λ, before reaching a saturation value that depended on interface widths. The results indicate that superlattice strength/hardness depends strongly on interface widths and the difference in shear moduli of the two components for Λ values below the maximum, and on the average shear modulus for larger Λ.

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  1. Department of Materials Science and Engineering, Northwestern University, Evanston, 60208, IL, USA

    XI Chu & Scott A. Barnett

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  1. XI Chu
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  2. Scott A. Barnett
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Correspondence to XI Chu.

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Chu, X., Barnett, S.A. A Model of Superlattice Yield Stress and Hardness Enhancements. MRS Online Proceedings Library 382, 291 (1995). https://doi.org/10.1557/PROC-382-291

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