Abstract
Structural properties of molecular beam epitaxy-grown Bi2Sr2Cu1Oy’Bi2Sr2Ca1Cu2Oy multilayers have been studied by x-ray diffraction. A one-dimensional kinematic x-ray diffraction model has been used to describe the structural quality of the multilayers. Interface roughness, stacking defects and unit cell disorder are obtained by an iterative fitting of the calculated diffraction profile to the experimental spectra. The type and amount of disorder in the films was qualitatively determined. Results demonstrate that structural imperfections are present in the multilayers and have to be considered when transport properties are studied.
Similar content being viewed by others
References
See for instance, L. Maritato, A.M. Cucolo, R. Vaglio, C. Noce, J. L. Makous and CM. Falco, Phys. Rev. B 38, 12917 (1988), and references therein.
J.Z. Wu, C.S. Ting, W.K. Chu and X.X. Yao, Phys. Rev. B 44, 411 (1991).
M. Rasolt, T. Edis and Z. Tešanović, Phys. Rev. Lett. 66, 2927 (1991).
S. Sakai, Phys. Rev. B 47, 9042 (1993).
T. Matsumoto, T. Kawai, K. Kitahama, S. Kawai, I. Shigaki and Y. Kawate, Appl. Phys. Lett. 58, 2039(1991).
J-P. Locquet, A. Catana, E. Mächler, Ch. Gerber and J. G. Bednorz, Appl. Phys. Lett. 64, 372 (1994).
I. Bozovic, J.N. Eckstein, G.F. Virshup, A. Chaiken, M. Wall, R. Howell and M. Fluss, J. Supercond. 7, 187(1994).
Ph. Lerch, F. Marcenat, Ph. Jacot, D. Ariosa, J. Perret, Ch. Leemann, P. Martinoli, M. Cantoni, H.R. Ott, Physica C 242, 30 (1995).
A. Vailionis, A. Brazdeikis and A.S. Flodström, Phys. Rev. B 51, 3097 (1995).
T. Hatano, K. Nakamura, H. Narita, J. Sato, S. Ikeda and A. Ishii, J. Appl. Phys. 75, 2141 (1994).
H.A. Brazdeikis, A. Vailionis and A.S. Flodström, (unpublished).
E. E. Fullerton, I. K. Schuller, H. Vanderstraeten and Y. Bruynseraede, Phys. Rev. B 45, 9292 (1992).
Reflection high-energy electron diffraction oscillations and scanning tunneling microscopy have shown that Bi-based superconducting cuprates grow sequentially, a half unit cell by a half unit cell.
L. Ranno, D. Martínez-Garcia, J. Perrière and P. Barboux, Phys. Rev. B 48, 13 945 (1993).
J. M. Tarascon, W. R. McKinnon, P. Barboux, D. M. Hwang, B. G. Bagley, L. H. Greene, G. W. Hull, Y. LePage, N. Stoffel and M. Giroud, Phys. Rev. B 38, 8885 (1988).
Y. Zhao, G.D. Gu, G.J. Russell, N. Nakamura, S. Tajima, J.G. Wen, K. Uehara and N. Koshizuka, Phys. Rev. B 51, 3134 (1995).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Vailionis, A., Brazdeikis, A. & FlodstrÖm, A.S. Superconducting Multilayers: Microstructural Properties Studied by X-Ray Diffraction. MRS Online Proceedings Library 382, 217 (1995). https://doi.org/10.1557/PROC-382-217
Published:
DOI: https://doi.org/10.1557/PROC-382-217