Fragmentation of C60 Molecules in Partially Ionized Fullerene Beam Deposition

MRS Online Proceedings Library volume 359, pages429–432(1994)Cite this article

Abstract

C60 films have been deposited using a partially ionized cluster beam deposition (PIBD) technique. The experimental results show that as Va exceeds about 400 V almost all the C60 molecules fragmentate at collision with the substrate and the obtained films turn to be amorphous carbon layers at elevated Va indicated by measurements of Raman spectra, X-ray diffraction, and ellipsometry.

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Affiliations

  1. Department of Physics, Fudan University, Shanghai, 200433, P.R. China

    Ren Zhong-Minren, Xiong Xia-Xingxiong, Du Yuan-Chengdu, Ying Zhi-Fengying, Liang-Yao Chen & Fu-Ming Li

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  1. Ren Zhong-Minren
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  2. Xiong Xia-Xingxiong
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  3. Du Yuan-Chengdu
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  4. Ying Zhi-Fengying
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Correspondence to Ren Zhong-Minren.

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Zhong-Minren, R., Xia-Xingxiong, X., Yuan-Chengdu, D. et al. Fragmentation of C60 Molecules in Partially Ionized Fullerene Beam Deposition. MRS Online Proceedings Library 359, 429–432 (1994). https://doi.org/10.1557/PROC-359-429

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