Abstract
Amorphous TbFe films with perpendicular magnetic anisotropy are attracting wide attention as promising candidates for erasable high - density magneto - optical recording and thermomagnetic printing. TbxFe1-x thin films with 0 ≤ x ≤ 0.37 are deposited on glass substrates using r.f. sputtering. The magnetic remanent domain structures are studied at room temperature using the longitudinal and polar Kerr effect. Samples with 0 ≤ x ≤ 0.23 exhibit magnetic in-plane anisotropy, while samples with 0.26 ≤ x ≤0.37 possess uniaxial anisotropy with easy axis perpendicular to the film plane. The remanent domain structures depend strongly on Tb content. High remanence and high coercivity are found for samples with 0.27 ≤ x ≤ 0.34 which is confirmed by additional vibrating sample magnetometer (VSM) measurements.
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Acknoledgments
We thank Prof. A. Hubert for using the magnetic domain observation equipment and Mr. M. Haidl for his assistance in VSM measurements. This work was supported by the National Science Foundation, the Welch Foundation, the Texas Higher Education Coordinating Board and the Alexander von Humboldt Foundation.
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Florescu, V., Rau, C. & Zheng, N.J. Strong Influence of Tb Concentration on Domain Structure and Kerr Effect of TbxFe 1-x Thin Films. MRS Online Proceedings Library 313, 327–332 (1993). https://doi.org/10.1557/PROC-313-327
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DOI: https://doi.org/10.1557/PROC-313-327