• Article metrics
  • Last updated: Wed, 14 Apr 2021 20:15:46 Z

Growth and High Resolution Tem Characterization of GexSi1-x/Si Hetero-Structures by Remote Plasma-Enhanced Chemical Vapor Deposition

Access & Citations

  • Data not available
    Article Accesses
  • 0
    Web of Science
  • 0

Citation counts are provided from Web of Science and CrossRef. The counts may vary by service, and are reliant on the availability of their data. Counts will update daily once available.