Investigation Of YBa2Cu3O7-gd Films Grown on Vicinally-Polished MgO Substrates

Abstract

X-ray diffraction and transmission electron microscopy have been used to study the morphology and defect structure of YBa2Cu3O7-δ films on {xc[001]} MgO substrates polished away from the {xc[001]} crystallographic axis towards either {xc[010]} or {xc[110]} by angles ranging from 1° to 20°. On the {xc[010]} off-axis substrates it was found that growth of the YBCO film was highly influenced by the surface normal of the substrate with only very weak alignment to the substrate {xc[001]} direction. All {xc[010]}-angled samples maintained Tcs's of 86K. Angles of 1°, 2.5°, and 5° toward {xc[010]} produced films with large mosaic spread parallel to the direction of the angle, as high as 4° FWHM for the 5° sample. Critical current densities of these films remained as high as those of films grown on on-axis substrates, e.g. 4.4x107 A/cm2 at 4.2 K and zero applied field. Larger off-axis angles led to samples with reduced mosaic spread but still alignment to the surface normal, and reduced Jcs's of 2x107 A/cm2 and 1xl05 A/cm2 for 10° and 20° angles, respectively. TEM investigation and in-plane x-ray examination of the 5°, 10°, and 20° samples show good in-plane texture except for the 20° sample, and increased granularity with angle. Films on substrates polished off-axis towards {xc[110]} have degraded Tcs's and Jcs's for all angles.

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Acknowledgement

This work was supported by EPRI under contract #RP8009- 11, and by the Stanford Center for Materials Research through the NSF-MRL program. We would also like to thank South Bay Technology for the use of a Model 515 Dimpler, G. Waychunas of CMR for help

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Correspondence to S. K. Streiffer.

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Streiffer, S.K., Lairson, B.M. & Bravman, J.C. Investigation Of YBa2Cu3O7-gd Films Grown on Vicinally-Polished MgO Substrates. MRS Online Proceedings Library 209, 777–782 (1990). https://doi.org/10.1557/PROC-209-777

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