Study of Surface Defects With the Reflected Electrons

Abstract

Studying crystal surfaces using the forward scattered high energy electrons Is discussed.Performance and applications of the basic REM and several variations of this technique are presented.

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References

  1. 1.

    "Reflection high-energy electron diffraction and reflection electron imaging of surfaces", eds. P.K. Larsen and P.J. Dobson, NATO ASI series B: Physics Vol.188, Plenum press, NY (1988).

    Google Scholar 

  2. 2.

    A special issue on current research on reflection electron microscopy, J. Electron Microscopy Tech., in press.

  3. 3.

    Tung Hsu, G.S. Petrich and P.I Cohen, in Proceedings of the XIIth International Congress for Electron Microscopy, Seattle, (1990) vol. 4, pp. 720–721.

    Google Scholar 

  4. 4.

    K. Fujiwara, K. Kanamoto, Y.N. Ohta, Y. Tokuda, and Y. Nakayama, J. Cryst. Growth, 80:104(1987).

    CAS  Article  Google Scholar 

  5. 5.

    Tung Hsu and Y.T. Kim, Ultramicroscopy, (1990).

    Google Scholar 

  6. 6.

    N. Osakabe, Y. Tanishiro, K. Yagi, and G. Honjo, Surface Sci., 102:424 (1981).

    CAS  Article  Google Scholar 

  7. 7.

    L. M. Peng and J. M. Cowley, Acta Cryst., A42:545 (1986).

    CAS  Article  Google Scholar 

  8. 8.

    L. M. Peng, J. M. Cowley, and Tung Hsu, Micron and Microscopia Acta, 18/3:179 (1987).

    Article  Google Scholar 

  9. 9.

    Y. Ma, Ph.D. Dissertation, Northwestern University (1990).

    Google Scholar 

  10. 10.

    H. Banzhof, K.H. Hermann, and H. Uchte, in Proceedings of the 9th European Congress on Electron Microscopy, Vol. 1:264 (1988).

    Google Scholar 

  11. 11.

    N. Osakabe, T. Matsuda, J. Endo and A. Tonomura, Japan J. Appl. Phys. 27:L1772 (1988).

    CAS  Article  Google Scholar 

  12. 12.

    M. Takeguchi, K. Harada, and R. Shimizu, I. Electron Microsc. 39:269 (1990).

    CAS  Google Scholar 

  13. 13.

    Tung Hsu, Sumio lijima, and J. M. Cowley, Surface Sci., 137: 551 (1984).

    CAS  Article  Google Scholar 

  14. 14.

    L. M. Peng and J. M. Cowley, Micron and Microscopia Acta, 18/3:171 (1987).

    Article  Google Scholar 

  15. 15.

    Tung Hsu and J. M. Cowley, in "The Structure of Surfaces", eds. M. A. Van Hove and S. Y. Tong, Springer, Berlin (1985) pp. 55–59.

  16. 16.

    K. Yagi, K. Takayanagi, and G. Honjo, In "Crystals, Growth, Properties, and Applications 7", Springer-Verlag, Berlin (1982) pp. 47–74.

    Google Scholar 

  17. 17.

    K. Yagi, J. Appl. Crys. 20 (June):147 (1987).

    CAS  Article  Google Scholar 

  18. 18.

    G. Lehmpfuhl and Y. Uchida, Surface Sci., 235:295 (1990).

    CAS  Article  Google Scholar 

  19. 19.

    P.A. Crozier, M. Gajdardziska-Josifovska, and J.M. Cowley, Proceedings of the Xllth International Congress for Electron Microscopy, Seattle, (1990) V. 4, p. 280.

    Google Scholar 

  20. 20.

    Tung Hsu and Y.T. Kim, Surface Sci., in press.

  21. 21.

    Tung Hsu, J. Vac. Sci. Technol., B3:1035 (1985).

    Article  Google Scholar 

  22. 22.

    N. Yamamoto, Japanese J. of Appl. Phys. 28:L 2147 (1989).

    Article  Google Scholar 

  23. 23.

    L. Faist, J.-D. Ganiere, Ph. Buffat, S. Sampson, and F.-K. Reinhart, J. Appl. Phy., 66:1023 (1989).

    CAS  Article  Google Scholar 

  24. 24.

    A.V. Latyshev, A.L. Aseev, A.B. Krasilnikov, and S.I. Stenin, Surface Sci., 213:157 (1989).

    CAS  Article  Google Scholar 

  25. 25.

    Y. Uchida, G. Lehmpfuhl, and J. Jäger, Ultramicroscopy, 13:119 (1984).

    Article  Google Scholar 

  26. 26.

    T. Twomey, Y. Uchida, G. Lehmpfuhl and D.M. Kolb, Zeitschrift for Physikalische Chemie Neue Folge, 160/S:1 (1988).

    Article  Google Scholar 

  27. 27.

    Z.L. Wang and A. Howie, Surface Sci., 226:293 (1990)

    CAS  Article  Google Scholar 

  28. 28.

    A. Claverie, J. Faure, C. Vieu, J. Beauvillain, and B. Jouffrey, J. Physique, 47:1805 (1986).

    CAS  Article  Google Scholar 

  29. 29.

    J. M. Cowley, J. Electron Microsc., 36:72 (1987).

    CAS  Google Scholar 

  30. 30.

    Z. L. Wang and R.F. Egerton, Surface Sci., 205:25 (1988)

    CAS  Article  Google Scholar 

  31. 31.

    J. Liu and J. M. Cowley, private communication.

  32. 32.

    D.A. Smith and M.M.J. Treacy, Appl. Surface Sci., 11/12:131(1982).

    Article  Google Scholar 

  33. 33.

    K. Kuroda, S. Hosoki and T. Komoda, J. Electron Microscopy, 34:179 (1985).

    CAS  Google Scholar 

  34. 34.

    Y. Uchida, G. Weiberg, and G. Lehmpfuhl, J. Electron Microscopy Tech., press.

  35. 35.

    J. Liu, P.A. Crozier, and J.M. Cowley, in Proceedings of the XIIth International Congress for Electron Microscopy, Seattle, (1990) V.1, p. 334.

    Google Scholar 

  36. 36.

    S. Ino, A. Endo, and H Daimon, in Proceedings of the Third International Conference on the Structure of Surfaces 1990 Milwaukee.

  37. 37.

    J.C.H. Spence, W. Lo and M. Kuwabara, Ultramicroscopy, 33:69 (1990).

    CAS  Article  Google Scholar 

  38. 38.

    Y. Kondo, K. Yagi, K Kobayashi, H. Kobayashi, and Y. Yanaka, in Proceedings of the XIlth International Congress for Electron Microscopy, Seattle, (dy1990}) vol. 1, pp. 350–351.

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Acknowledgement

Work presented here was supported by NSF Grant DMRs-8717376 and has made use of the Electron Microscopy Lab. in the Dept. of MSE, U. of Utah, the High Resolution Electron Microscopy Facility at Arizona State University, and the facility at Fritz-Haber-lnstitut der Max- Planck-Gesellschaft.

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Hsu, T. Study of Surface Defects With the Reflected Electrons. MRS Online Proceedings Library 209, 629–635 (1990). https://doi.org/10.1557/PROC-209-629

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