Study of Surface Defects With the Reflected Electrons


Studying crystal surfaces using the forward scattered high energy electrons Is discussed.Performance and applications of the basic REM and several variations of this technique are presented.

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Work presented here was supported by NSF Grant DMRs-8717376 and has made use of the Electron Microscopy Lab. in the Dept. of MSE, U. of Utah, the High Resolution Electron Microscopy Facility at Arizona State University, and the facility at Fritz-Haber-lnstitut der Max- Planck-Gesellschaft.

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Hsu, T. Study of Surface Defects With the Reflected Electrons. MRS Online Proceedings Library 209, 629–635 (1990).

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