Abstract
Capacitance bridge measurements at low temperature on irradiated specimens of p and n-type Si are reported. Electronic defect levels are seen at {ie439-1} and {ie439-2} The change of the band structure caused by irradiation is also described.
Similar content being viewed by others
References
S.D. Kouimtzi and P.C. Banbury, J.Phys.C:Solid State 14, 3701 (1981)
G.D. Watkins, Lattice Defects in Semiconductors 1974 Ed. F.A. Huntley (Institute of Physics, London, p1 (1975).
S.D. Kouimtzi, J.Phys. C:Solid State 15, 2169 (1982): ed ibid Condensed Matter 1, 1437, (1987).
R.E. McKeighen and J.S. Koehler, Phys.Rev. 134, 462,(1971)
A.H. Kalma IEEE Trans, Nucl. Sci. NS20, 224,(1973).
J.C. Bourgoin and J.W. Corbett, Phys, Lett. 38A135, (1972).
G.D. Watkins, Defects and Radiation Effects in Semiconductors 1978, Ed. J.H. Albany (Institute of Physics, London, (1979) p.16.
S.K. Bains and P.C. Banbury, J. Phys. C:Solid State 18 L109, (1985).
A.R. Bean, R.C. Newman and R.S. Smith, J.Phys. Chem. Solids 31, 739 (1970).
K.L. Brower, Phys, Rev. B 9, 2607, (1974)
G.D. Watkins and J.R. Troxell, Phys, Rev, Lett. 4, 593, (1980).
B. Massarani and A. Brelot,Defects in Semicontuctors 1972 Ed. J.W Whitehouse (Institute of Physics, London 1972) p.269.
G.E. Jellison JR, J.Appl. Phys. 53 5715,(1982).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Kouimtzi, S.D., J, J. Evidence of Defect Levels in p and n-Type Electron Irradiated Si. MRS Online Proceedings Library 209, 439–444 (1990). https://doi.org/10.1557/PROC-209-439
Published:
Issue Date:
DOI: https://doi.org/10.1557/PROC-209-439