Abstract
Our present knowledge on self-interstitials in silicon and the rôle these defects play under widely different experimental conditions are surveyed. In particular, the following phenomena involving self-interstitials either in supersaturations or under high-temperature thermal-equilibrium conditions are considered: mobility-enhanced diffusion of self-interstitials below liquid-helium temperature, thermally activated diffusion of self-interstitials at inter-mediate temperatures (14O K to 600 K), concentration-enhanced diffusion of Group-III or Group-V elements in silicon at higher temperatures, and— as examples for high-temperature equilibrium phenomena — self-diffusion and diffusion of gold in silicon. This leads to the picture that the self-interstitials in silicon may occur in different electrical charge states and possess dumbbell configurations or are extended over several atomic volumes at intermediate or high temperatures, respectively.
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References
- 1.
G. D. Watkins, in: Radiation Damage in Semiconductors, P. Baruch ed. (Dunod, Paris 1964) p. 97.
- 2.
G. D. Watkins, in: Lattice Defects in Semiconductors 1974, F. A. Huntley ed. (Institute of Physics, London and Bristol 1975), Inst. Phys. Conf. Ser. No. 23, p. 1.
- 3.
K. L. Brower, Phys. Rev. B 1, 1908 (1970).
- 4.
R. E. McKeighen and J. S. Koehler, Phys. Rev. B 4, 462 (1971).
- 5.
P. S. Gwozdz and J. S. Koehler, Bull. Am. Phys. Soc. 17, 307 (1972).
- 6.
J. Arimura and J. W. MacKay, in: Radiation Effects in Semiconductors, F. L. Vook ed. (Plenum Press, New York 1968) p. 204.
- 7.
W.D. Hyatt and J. S. Koehler, Phys. Rev. B 4, 1903 (1971).
- 8.
A. Seeger and K.P. Chik, phys. stat. sol. 29, 455 (1968).
- 9.
A. Seeger, Rad. Effects 9, 15 (1971).
- 10.
A. Seeger and W. Frank, in: Radiation Damage and Defects in Semiconductors, J. E. Whitehouse ed. (Institute of Physics, London and Bristol 1972) p. 262.
- 11.
W. Frank, in: Lattice Defects in Semiconductors 1974, F. A. Huntley ed. (Institute of Physics, London and Bristol 1975), Inst. Phys. Conf. Ser. No. 23, p. 23.
- 12.
A. Seeger, H. Föll, and W. Frank, in: Radiation Effects in Semiconductors 1976, N. B. Urli and J. W. Corbett eds. (Institute of Physics, Bristol and London 1977), Inst. Phys. Conf. Ser. No. 31, p. 12.
- 13.
A. Seeger, W. Frank, and U. Gösele, in: Defects and Rad. Effects in Semiconductors 1978, J. H. Albany ed. (Institute of Physics, Bristol and London 1979), Inst. Phys. Conf. Ser. No. 46, p. 148.
- 14.
H. M. James and K. Lark-Horovitz, Z. Phys. Chem. (Leipzig) 198, 107 (1951).
- 15.
E. I. Blount, J. Appl. Phys. 30, 1218 (1959).
- 16.
G. D. Watkins, R. P. Messmer, C. Weigel, D. Peak, and J. W. Corbett, Phys. Rev. Lett. 27, 1573 (1971).
- 17.
G. Hettich, H. Mehrer, and K. Maier, in: Defects and Radiation Effects in Semiconductors 1978, J. H. Albany ed. (Institute of Physics, Bristol and London 1979), Inst. Phys. Conf. Ser. No. 46, p. 500.
- 18.
G. L. McVay and A. R. DuCharme, in: Lattice Defects in Semiconductors 1974, F. A. Huntley ed. (Institute of Physics, Bristol and London 1975), Inst. Phys. Conf. Ser. No. 23, p. 91.
- 19.
D. Shaw, phys. stat. sol. (b) 72, 11 (1975).
- 20.
J. A. van Vechten and C. D. Thurmond, Phys. Rev. B 14, 3551 (1976).
- 21.
R. B. Fair, in: Semiconductor Silicon 1977, H. R. Huff and E. Sirtl eds. (Electrochemical Society, Princeton 1977) p. 968.
- 22.
G. D. Watkins, J. R. Troxell, and A. P. Chatterjee, in: Lattice Defects in Semiconductors 1978, J. H. Albany ed. (Institute of Physics, Bristol and London 1979), Inst. Phys. Conf. Ser. No. 46, p. 16.
- 23.
S. M. Hu, J. Appl. Phys. 45, 1567 (1974).
- 24.
S. M. Hu, J. Vac. Sci. Technol. 14, 17 (1977).
- 25.
E. Sirtl, in: Semiconductor Silicon 1977, H. R. Huff and E. Sirtl eds. (Electrochemical Society, Princeton, 1977) p. 4.
- 26.
S. I. Tan, B. S. Berry, and W. Frank, in: Ion Implantation in Semiconductors and Other Materials, B. L. Crowder ed. (Plenum Press, New York and London 1973) p. 19.
- 27.
W. Frank, U. Gösele, and A. Seeger, in: Proceedings of the International Conference on Radiation Physics in Semiconductors and Related Materials (Tbilisi/USSR, September 1979), in the press.
- 28.
H. J. Mayer, H. Mehrer, and K. Maier, in: Radiation Effects in Semiconductors 1976, N. B. Urli and J. W. Corbett eds. (Institute of Physics, Bristol and London 1977), Inst. Phys. Conf. Ser. No. 31, p. 186.
- 29.
A. K. Jonscher, Principles of Semiconductor Device Operation (Wiley, New York 1960).
- 30.
L. J. Bernewitz and K. R. Mayer, phys. stat. sol. (a) 16, 579 (1973).
- 31.
A. J. R. de Kock, Phillips Res. Rep., Suppl. 4, 1 (1973).
- 32.
H. Föll and B. O. Kolbesen, Appl. Phys. 8, 319 (1975).
- 33.
P. M. Petroff and A. J. R. de Kock, J. Cryst. Growth 30, 117(1975).
- 34.
H. Poll, B. O. Kolbesen, and W. Frank, phys. stat. sol. (a) 29, K 83 (1975).
- 35.
L. C. Kimerling, in: Defects and Radiation Effects in Semiconductors 1978, J. H. Albany ed. (Institute of Physics, Bristol and London 1979), Inst. Phys. Conf. Ser. No. 46, p.56.
- 36.
J. C. Bourgoin and J. W. Corbett, Rad. Effects 36, 157 (1978).
- 37.
U. Gösele, W. Frank, and A. Seeger, in: Defects and Radiation Effects in Semiconductors 1978, J. H. Albany ed. (Institute of Physics, Bristol and London 1979), Inst. Phys. Conf. Ser. No. 46, p. 538.
- 38.
A. Seeger and H. Mehrer, in: Vacancies and Interstitials in Metals, A. Seeger, D. Schumacher, W. Schilling, and J. Diehl eds. (North-Holland, Amsterdam 1970) p. 1.
- 39.
H. Mehrer, J. Nuclear Materials 69/70, 38 (1978).
- 40.
J. R. Troxell, A. P. Chatterjee, G. D. Watkins, and L. C. Kimerling, Phys. Rev. B 19, 5 336 (1979).
- 41.
L. C. Kimerling and D. V. Lang, in: Lattice Defects in Semiconductors 1974, F. A. Huntley ed. (Institute of Physics, London and Bristol 1975), Inst. Phys. Conf. Ser. No. 23, page 589.
- 42.
J. D. Weeks, J. C. Tully, and L. C. Kimerling, Phys. Rev. B. 12, 3286 (1975).
- 43.
J. C. Bourgoin and J. W. Corbett, Phys. Lett. 38A, 135 (1972).
- 44.
J. R. Troxell and G. D. Watkins, Phys. Rev. B 22, 921 (1980).
- 45.
B. J. Masters and E. F. Gorey, J. Appl. Phys. 49, 2717 (1978).
- 46.
W. M. Lomer, Harwell Report 1540 (AERE, Harwell 1954).
- 47.
J.G. Dienes and A. C. Damask, J. Appl. Phys. 29, 1713 (1958).
- 48.
R. Sizmann, J. Nuclear Material 69/70, 386 (1978).
- 49.
P. Baruch, J. Monnier, B. Blanchard, and C. Castaing, Appl. Phys. Lett. 26, 77 (1975).
- 50.
P. Baruch, in: Radiation Effects in Semiconductors 1976, N. B. Urli and J. W. Corbett eds. (Institue of Physics, Bristol and London 1977), Inst. Phys. Conf. Ser. No. 31, p. 126 (1977).
- 51.
W. Akutagawa, H. L. Dunlop, R. Hart, and O. J. Marsh, J. App. Phys. 50, 777 (1979).
- 52.
P. R. Okamoto and L. E. Renn, J. Nuclear Materials 83, 2 (1979).
- 53.
U. Gösele and H. Strunk, Appl. Phys. 20, 265 (1979).
- 54.
F. Seitz, Acta Cryst. 3, 355 (1950).
- 55.
D. G. Nelson, J. F. Gibbson, and W. S. Johnson, Appl. Phys. Lett. 15, 246 (1969).
- 56.
K. Gamo, K. Masuda, S. Namba, S. Ishihara, and I. Kimura, Appl. Phys. Lett. 17, 391 (1970).
- 57.
W. G. Allen, Sol. State Electr. 16, 709 (1973).
- 58.
D. A. Antoniadis, A. G. Gonzalez, and R. W. Dutton, J. Electrochem. Soc. 127, 2243 (1980).
- 59.
K. H. Nickolas, Sol. State Electr. 9, 35 (1966).
- 60.
G. Masetti, S. Solmi, and G. Soncini, Sol. State Electr. 16, 1419 (1973).
- 61.
G. Masetti, S. Solmi, and G. Soncini, Phil. Mag. 33, 613 (1976).
- 62.
R. Francis and P. S. Dobson, J. Appl Phys. 50, 280 (1979).
- 63.
D. A. Antonidis, A. M. Lin, and R. W. Dutton, Appl. Phys. Lett. 33, 1030 (1978).
- 64.
S. M. Hu, in: Diffusion in Semiconductors, D. Shaw ed. (Plenum Press, London 1973) p. 217.
- 65.
A. F. W. Willoughby, Rep. Prog. Phys. 41, 1665 (1978).
- 66.
A. F. W. Willoughby, J. Phys. D 10, 455 (1977).
- 67.
U. Gösele and W. Frank, in these proceedings.
- 68.
B. Leroy, J. Appl. Phys. 50, 7996 (1979).
- 69.
C. L. Claeys, G. J. Declerck, and R. J. van Overstraeten, in: Semiconductor Characterization Techniques, P. A. Barnes and G. A. Rozgonyi eds. (Electrochemical Society, Princeton 1978) p. 366.
- 70.
W. R. Wilcox and T. J. LaChapelle, J. Appl. Phys. 35, 240 (1964).
- 71.
W. R. Wilcox, T. J. LaChapelle, and D. H. Forbes, J. Electrochem. Soc. 111, 1377 (1964).
- 72.
M. J. Hill, M. Lietz, R. Sittig, W. Frank, U. Gösele, and A. Seeger, in: Proceedings of the International Conference on Radiation Physics in Semiconductors and Related Materials (Tbilisi/USSR, September 1979), in the press.
- 73.
G. J. Sprokel and J. M. Fairfield, J. Electrochem. Soc. 112, 200 (1965).
- 74.
J. L. Lambert, Wiss. Ber. AEG-Telefunken 45, 153 (1972).
- 75.
W. C. Dash, J. App. Phys. 31, 2275 (1960).
- 76.
F. A. Huntley and A. F. W. Willoughby, Solid-State Electronics 13, 1231 (1970).
- 77.
F. A. Huntley and A. F. W. Willoughby, J. Electrochem. Soc. 120, 414 (1973).
- 78.
F. A. Huntley and A. F. W. Willoughby, Phil. Mag. 28, 1319 (1973).
- 79.
F. C. Frank and D. Turnbull, Phys. Rev. 104, 617 (1956).
- 80.
U. Gösele, W. Frank, and A. Seeger, Appl. Phys. 23, 361 (1980).
- 81.
A. Seeger, phys. stat. sol. (a) 61, 521 (1980).
- 82.
M. D. Sturge, Proc. Phys. Soc. (Lond.) 73, 297 (1959).
- 83.
A. Seeger and W. Frank, to be published.
- 84.
W. Meyberg, unpublished.
- 85.
W. M. Bullis, Solid-State Electronics 9, 143 (1966).
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Frank, W., Seeger, A. & Gösele, U. From the Mystery to the Understanding of the Self-Interstitials in Silicon. MRS Online Proceedings Library 2, 31 (1980). https://doi.org/10.1557/PROC-2-31
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