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X-Ray Reflectivity and Fluorescence Measurements From Polystyrene-Co-Bromostyrene/Polystyrene Interfaces

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Abstract

X-ray fluorescence using synchrotron radiation at glancing angles of incidence was used to measure interface widths for the highly immiscible polymer blend system polystyrene/polybromostyrene (PS/PBrxS, with bromination level x = 0.8 bromine atoms per monomer). The interfacial widths are for bilayers annealed for 4 hours and 24 hours at 141±1C are found to be 100± 20Å and 110±20Å respectively.

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Authors and Affiliations

  1. Queens College, Flushing, NY, USA

    J. Sokolov, M. Rafailovich & X. Zhao

  2. Argonne National Laboratory, Argonne, IL, USA

    W. B. Yun

  3. Cornell University, Ithaca, NY, USA

    R. A. L. Jones & E. J. Kramer

  4. University Of Massachusetts at Amherst, Amherst, MA, USA

    R. J. Composto & R. S. Stein

  5. Brooklyn College, Brooklyn, NY, USA

    A. Bommannavar

  6. Oak Ridge National Laboratory, Oak Ridge, Tenn, USA

    M. Engbretson

Authors
  1. J. Sokolov
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  2. M. Rafailovich
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  3. X. Zhao
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  4. W. B. Yun
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  5. R. A. L. Jones
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  6. E. J. Kramer
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  7. R. J. Composto
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  8. R. S. Stein
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  9. A. Bommannavar
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  10. M. Engbretson
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Sokolov, J., Rafailovich, M., Zhao, X. et al. X-Ray Reflectivity and Fluorescence Measurements From Polystyrene-Co-Bromostyrene/Polystyrene Interfaces. MRS Online Proceedings Library 171, 337–342 (1989). https://doi.org/10.1557/PROC-171-337

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  • DOI: https://doi.org/10.1557/PROC-171-337

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