Solving the Structure of Interfaces by High Resolution Electron Microscopy

Abstract

This paper reviews some of the new advancements made in solving the structure of planar interfaces in a wide range of materials and interface types. The main contributions of the HREM technique are the determination of the atomic positions at the interface, the detection of additional defects such as dislocations or monoatomic steps and more recently the chemical composition when crossing the interface. It is concluded that quantitative results obtained by image processing and pattern recognition will in the future greatly improve the knowledge of interfacial structures at an atomic scale.

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Correspondence to Alain Bourret.

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Bourret, A. Solving the Structure of Interfaces by High Resolution Electron Microscopy. MRS Online Proceedings Library 139, 3–14 (1988). https://doi.org/10.1557/PROC-139-3

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