The high resolution electron microscope is powerful for modern materials science, because of its direct observation capability for the atomic structure of materials. The JEM-4000EX, a 400 kV accelerating voltage electron microscope whose objective lens has a 1 mm spherical aberration coefficient, has a 0.168 nm theoretical resolving power. Using this microscope, atomic structure images of high Tc superconductor such as Y-Ba-Cu-O, Bi-Ca-Sr-Cu-O and Tl -Ca-Ba-Cu-O were observed.
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Honda, T., Ibe, K., Ishida, Y. et al. Performance of Ultrahigh Resolution Electron Microscope JEM-4000EX and some Applications of High Tc Superconductor. MRS Online Proceedings Library 139, 241–250 (1988). https://doi.org/10.1557/PROC-139-241