Hexagotnal Silicon: A New Hrem Study

MRS Online Proceedings Library volume 139, pages199–204(1988)Cite this article

Abstract

A new high resolution electron microscopy investigation of indentationinduced hexagonal silicon has been carried out using the JEOL 4000EX electron microscope. The better resolution of the microscope enables one to extract more structural information about this intriguing phase and its interface with the cubic phase. A new structural model for the cubic/- hexagonal interface is presented. Image simlations are carried out over a wide range of thickness and defocus for the new model and also a previous model due to Tan et al.

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Affiliations

  1. Department of Materials Science and Engineering, Case Western Reserve University, Cleveland, OH, 44106, USA

    P. Pirouz, J. Yang, F. Ernst & H. -J. Möller

Authors
  1. P. Pirouz
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  2. J. Yang
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  3. F. Ernst
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  4. H. -J. Möller
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Correspondence to P. Pirouz.

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Pirouz, P., Yang, J., Ernst, F. et al. Hexagotnal Silicon: A New Hrem Study. MRS Online Proceedings Library 139, 199–204 (1988). https://doi.org/10.1557/PROC-139-199

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