High resolution electron micrographs have been obtained in various orientations for δ2-Y2Si2O7 using the Atomic Resolution Microscope (ARM) at the National Center for Electron Microscopy (NCEM). These ARM images were processed by masking the diffractogram of the digitized image in Fourier space and applying an inverse transform (using the SEMPER program at the NCEM Image Analysis Facility) in order to reveal details obscured by amorphous contrast originating in the glassy matrix. Processed experimental images from very thin regions of the crystalline phase were compared with images simulated from postulated models (SHRLI images); close agreement was obtained.
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Rai, R.S., O’keefe, M.A. & Thomas, G. δ2-Y2Si2O7 Structure Confirmed by Processing and Simulation of Atomic-Resolution Images. MRS Online Proceedings Library 139, 175–180 (1988). https://doi.org/10.1557/PROC-139-175