Abstract
A self-assembly driven process to synthesize island-structured dielectric films is presented. An intermetallic reaction in platinized silicon substrates provides preferential growth sites for the complex oxide dielectric (strontium-doped lead zirconate titanate) layer. Microscopy and spectroscopy analyses have been used to propose a mechanism for this structuring process. This provides a simple and scalable process to synthesize films with increased surface area for sensors, especially those materials with a complex chemistry.
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References
- 1
E. Comini, G. Faglia, G. Sberveglieri, Z. W. Pan, and Z. L. Wang, Appl. Phys. Lett. 81, 1869 (2002).
- 2
K. Kalantar-zadeh and B. Fry, Nanotechnology-Enabled Sensors, (Springer, Berlin, 2007).
- 3
Z. W. Pan, Z. R. Dai, and Z. L. Wang, Science 291, 1947 (2001).
- 4
J. Eriksson, V. Khranovskyy, F. Söderlind, P.-O. Käll, R. Yakimova, and A. L. Spetz, Sens. Actuators B 137, 94 (2009).
- 5
S. O’Brien, L. Brus, and C. B. Murray, J. Am. Chem. Soc. 123, 12085 (2001).
- 6
M.-S. Zhang, J. Yu, J. Chu, Q. Chen, and W. Chen, J. Mater. Proc. Technol. 137, 78 (2003).
- 7
S. J. Limmer, S. Seraji, M. J. Forbess, Y. Wu, T. P. Chou, C. Nguyen, and G. Cao, Adv. Mater. 13, 1269 (2001).
- 8
A. Nourmohammadim, M. A. Bahrevar, S. Schulze, and M. Hietschold, J. Mater. Sci. 43, 4753 (2008).
- 9
G. Korotcenkov, Sens. Actuators B 107, 209 (2005).
- 10
S. Sriram, M. Bhaskaran, J. du Plessis, K. T. Short, V. P. Sivan, and A. S. Holland, Micron 40, 104 (2009).
- 11
S. Sriram, M. Bhaskaran, and A. S. Holland, Semicond. Sci. Tech. 21, 1236 (2006).
- 12
M. Bhaskaran, S. Sriram, D. R. G. Mitchell, K. T. Short, and A. S. Holland, Thin Solid Films 516, 8101 (2008).
- 13
K. Wasa, M. Kitabatake, and H. Adachi, Thin Film Materials Technology: Sputtering of Compound Materials, (Springer-Verlag GmbH & Co. KG, Heidelberg, 2004).
- 14
T. S. Kim, D. J. Kim, and H. J. Jung, J. Appl. Phys. 86, 7024 (1999).
- 15
C.-K. Lee, C.-D. Hsieh, and B.-H. Tseng, Thin Solid Films 303, 232 (1997).
- 16
S. L. Firebaugh, K. F. Jensen, and M. A. Schmidt, J. Microelectromech. Syst. 7, 128 (1998).
- 17
K. Maex and M. van Rossum, Properties of Metal Silicides, (INSPEC, London, 1995).
- 18
M. Bhaskaran, S. Sriram, K. T. Short, D. R. G. Mitchell, A. S. Holland, and G. K. Reeves, J. Phys. D: Appl. Phys. 40, 5213 (2007).
- 19
S. Sriram, M. Bhaskaran, G. Kostovski, D. R. G. Mitchell, P. R. Stoddart, M. W. Austin, and A. Mitchell, J. Phys. Chem. C 113, 16610 (2009).
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Sriram, S., Bhaskaran, M. & Mitchell, A. Island Structured Dielectric Thin Films by Scalable Self-Assembly. MRS Online Proceedings Library 1253, 1029 (2010). https://doi.org/10.1557/PROC-1253-K10-29
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