Electrical properties of charging effect in Au nanoparticle memory device

Abstract

Semiconductors or metal nanoparticles (NPs) using their monolayer bindings with self-assembly chemicals are an attractive topic for device researchers. Electrical performance of such structures can be investigated for a particular application, such as memory device. Currently, Au NPs has been reported to show a substantial potential in the memory applications. In this study, Au NP and gluing layer were fabricated through a new method of monolayer formation of a chemical bonding or gluing. In this study, a new NPs memory system was fabricated by using organic semiconductor, i.e., pentacene as the active layer, evaporated Au as electrode, SiO2 as the gate insulator layer on silicon wafer. In addition, Au NPs coated with binding chemicals were used as charge storage elements on an APTES (3-amino-propyltriethoxysilane) as a gluing layer. In order to investigate chemical binding of Au NP to the gate insulator layer, GPTMS (3-glycidoxy-propyltrimethoxysilane) were coated on the Au NPs. As a result of that, a layer of gold nanoparticles has been incorporated into a metal-pentacene-insulator-semiconductor (MPIS) structure. The MPIS device with the Au NP exhibited a hysteresis in its capacitance versus voltage analysis. Charge storage in the layer of nanoparticles is thought to be responsible for this effect.

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Correspondence to Mok Jung Sung.

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Sung, M.J., Kim, HJ., Il-Seo, BJ.K. et al. Electrical properties of charging effect in Au nanoparticle memory device. MRS Online Proceedings Library 1207, 1075 (2009). https://doi.org/10.1557/PROC-1207-N10-75

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