• Article metrics
  • Last updated: Fri, 16 Apr 2021 9:03:33 Z

A Novel X-ray Diffraction –based Technique for Complete Stress State Mapping of Packaged Silicon Dies

Access & Citations

  • 1
    Article Accesses
  • 0
    Web of Science
  • 0

Citation counts are provided from Web of Science and CrossRef. The counts may vary by service, and are reliant on the availability of their data. Counts will update daily once available.