Utilization of Charged Particle Backscattering to Study the Near Surface Region of Glasses. Application to Depth Profiling of Lanthanium, Cerium, Thorium and Uranium Induced by Aqueous Leaching

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Correspondence to Patrick Trocellier.

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Work performed under contract WAS 268-81-55 F with European Community Commission.

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Trocellier, P., Nens, B. & Engelmann, C. Utilization of Charged Particle Backscattering to Study the Near Surface Region of Glasses. Application to Depth Profiling of Lanthanium, Cerium, Thorium and Uranium Induced by Aqueous Leaching. MRS Online Proceedings Library 11, 193 (1981). https://doi.org/10.1557/PROC-11-193

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